Journal profile · Engineering, Electrical & Electronic

Microelectronics Reliability

ISSN 0026-2714 · eISSN 1872-941X · Elsevier Ltd · ENGLAND · Monthly · Founded 1964

Microelectronics Reliability: CAS Zone 3 · Engineering (2025 upgraded edition); impact factor 2.42; hybrid open access; APC about USD 2,280; review about 121 days (submission to acceptance, publisher); community-reported acceptance: easy; 320 articles in 2025; indexed in SCIE and Scopus.

Impact factor2.42Latest value listed by LetPub
CAS zoneZone 3 · Engineering2025 upgraded edition, major category · 2026 Xinrui edition Zone 4 · Engineering
Review time121 daysPublisher-reported, submission to acceptance · community reports 2–4 weeks
APCUSD 2,280Hybrid journal: charged only for open-access articles
AcceptanceEasyCommunity average
Articles per year3202025 · OpenAlex count

Scope

Aims, scope and focus

Microelectronics Reliability is published by Elsevier Ltd and is in Zone 3 of Engineering in the CAS Journal Ranking (2025 upgraded edition). By OpenAlex counts of its recent articles, its largest topics are Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis and Advancements in Semiconductor Devices and Circuit Design, together about 33.3% of its articles. Its main subfields are Electrical and Electronic Engineering. (generated from OpenAlex topic counts and CAS ranking data)

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. All contributions are subject to peer review by leading experts in the field. Special issues are devoted to significant international conferences, or to important developing topics.Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.

From the journal's Aims & Scope

Research area (LetPub): Engineering, Electrical & Electronic

Editor-in-chief Bongtae HanPublisher website

Editorial board by country: 3 in mainland China (about 4%); most named United States 16, Italy 7, France 6, Taiwan, China 4, United Kingdom 4 (68 members with a country) Editorial board ↗Publisher website ·

Main research topics OpenAlex counts of recent articles; shares are approximate

  1. Semiconductor materials and devicesEngineering14.7%
  2. Integrated Circuits and Semiconductor Failure AnalysisEngineering9.5%
  3. Advancements in Semiconductor Devices and Circuit DesignEngineering9.1%
  4. Electronic Packaging and Soldering TechnologiesEngineering7.5%
  5. Reliability and Maintenance OptimizationEngineering6.8%
  6. 3D IC and TSV technologiesEngineering5.1%
  7. Silicon Carbide Semiconductor TechnologiesEngineering4.9%
  8. VLSI and Analog Circuit TestingComputer Science4%

Rankings & indexing

CAS ranking and database indexing

CAS Journal Ranking

CAS Journal Ranking, upgraded edition (March 2025)Engineering Zone 3
LevelCategoryZone
MajorEngineeringZone 3
MinorPhysics, AppliedZone 3
MinorEngineering, Electrical & ElectronicZone 4
MinorNanoscience & NanotechnologyZone 4

Top journal: noReview journal: no

CAS Xinrui Journal Ranking (March 2026)Engineering Zone 4
LevelCategoryZone
MajorEngineeringZone 4
MinorEngineering, Electrical & ElectronicZone 4
MinorNanoscience & NanotechnologyZone 4
MinorPhysics, AppliedZone 4

Top journal: noReview journal: not marked

CAS Journal Ranking, previous upgraded edition (December 2023)Engineering Zone 4
LevelCategoryZone
MajorEngineeringZone 4
MinorEngineering, Electrical & ElectronicZone 4
MinorNanoscience & NanotechnologyZone 4
MinorPhysics, AppliedZone 4

Top journal: noReview journal: no

Database indexing

SCIEScopusLetPub

International journal early-warning lists: not listed in any editionLetPub

Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.

Metrics

Impact metrics and publication volume

Impact

Impact factor
2.42LetPub ·
Impact factor (publisher)
2.5Publisher website ·
CiteScore 2026-06
4.5LetPub ·
CiteScore (publisher)
4.5Publisher website ·
SJR 2026-06
0.46LetPub ·
SNIP 2026-06
1.02LetPub ·
h-index
80LetPub ·
h-index
133OpenAlex ·
i10-index
5,174OpenAlex ·
2-year mean citedness
2.7OpenAlex ·
Self-citation rate
12%LetPub ·
Share of gold OA articles
17.15%LetPub ·

Volume

Articles per year
303LetPub ·

Articles by year OpenAlex count · 31,097 in total · the current year is incomplete

YearArticlesOpen accessCitations
20262538684
202532097879
2024189401,095
2023327812,456
2022347842,956
2021361994,204

Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.

Review & acceptance

Review time and acceptance

Review time from article dates manuscript dates registered with PubMed · to

Too few articlesOnly 2 articles from the last 24 months carry both submission and acceptance dates, too few for a median

Only articles that were accepted and published are counted, not the time spent on rejected manuscripts, so this usually runs longer than a publisher's "time to first decision".

Figures by source

Average review time (community reports)
2–4 weeksLetPub ·
Average acceptance (community reports)
EasyLetPub ·
Submission to first decision
2 daysPublisher website ·
First decision after review
47 daysPublisher website ·
Submission to acceptance
121 daysPublisher website ·
Acceptance to publication
8 daysPublisher website ·
Peer review
Single anonymous peer reviewPublisher website

Community reports come from authors' own submissions (confidence 0.5) and are not a promise from the journal; for publisher figures, the journal's own definitions apply.

Fees & open access

APC and open-access policy

Hybrid open accessLetPub

A subscription journal in which authors can pay to publish their article open access.

SourceAPCFee waiverLicenseObserved
OpenAlexUSD 2,280 / EUR 2,080 / GBP 1,830 / JPY 268,990——
Publisher websiteUSD 3,000——

A hybrid journal charges the APC only when the author chooses open access; publishing under the subscription model is usually free.

The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.

Submission

Article types and submission policies (journal website)

Open calls for papers1, by deadline
  1. Selected Papers from the 27th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2026)Deadline
Publisher website
What to prepare4 items from the author guidelines
Abstract
≤ 250 words
Keywords
1–7
Reference style
Numbered, in order of citation
Highlights
Required
Publisher website · model-extracted, each line checked against the text
Article types accepted2
  1. research papersMost accepted papers will be published as Research Papers, describing significant advances and completed work.Length not stated
  2. review papersPapers reviewing important developing topics of general interest may be accepted for publication as Review Papers.Length not stated
Publisher website
Policy excerpts from the journal's websiteAI use, Authorship, Conflicts of interest, Publication ethics, License & copyright, Open access, Peer review, Preprints
AI use Declaration of generative AI use

Authors must declare the use of generative AI tools in the manuscript preparation process upon submission of the paper.Generative AI and AI-assisted technologies (“AI tools”) have been rapidly adopted in research and scholarly publishing, offering significant benefits while requiring clear standards for responsible and transparent use.Authors preparing a manuscript for this journal may use AI tool…

Source ↗Publisher website ·
Authorship Group authorship

Group authorship refers to the attribution of an article to a defined and named group of authors whose members have contributed to the work. Examples include research consortia, clinical trial groups, collaborative networks, task forces or working groups, expert panels or consensus groups, and participatory research groups. Group authorship must be declared on the title page at submission. When av…

Source ↗Publisher website ·
Conflicts of interest Declaration of competing interests

All authors must disclose any financial and personal relationships with other people or organizations that could inappropriately influence or bias their work. Examples of potential competing interests include:EmploymentConsultanciesStock ownershipHonorariaPaid expert testimonyPatent applications or registrationsGrants or any other fundingAffiliation with the journal as an Editor or Advisory Board …

Source ↗Publisher website ·
Publication ethics

Publishing ethics Model summary

Authors must follow ethical guidelines stated in Elsevier's Publishing Ethics Policy.

Source ↗Publisher website ·
License & copyright License options

Authors will be offered open access user license options which will determine how you, and third parties, can reuse your open access article. We advise that you review these options and any funding body license requirements before selecting a license option.

Source ↗Publisher website ·
Open access Open access

We refer you to our open access information page to learn about open access options for this journal.

Source ↗Publisher website ·
Peer review Peer review

Single anonymized review process Model summary

This journal follows a single anonymized review process. Your submission will initially be assessed by our editors. If your submission is deemed suitable, it will typically be sent to be reviewed by a minimum of two reviewers for an independent expert assessment of the scientific quality. The decision as to whether your article is accepted or rejected for publication will be made by our editors.Re…

Source ↗Publisher website ·
Preprints Preprints

Preprint sharing Model summary

Preprint sharingAuthors may share preprints in line with Elsevier's article sharing policy. Sharing preprints, such as on a preprint server, will not count as prior publication.We advise you to read our policy on multiple, redundant or concurrent publication.

Source ↗Publisher website ·

Excerpts are quoted from the journal's website; "model summary" lines are written by Workers AI and checked against the text. The journal's website is authoritative.

Profile

Publication details and official links

Publisher
Elsevier Ltd
Country or region
ENGLAND
Language
English
Frequency
Monthly
Founded
1964
ISSN
0026-2714
Electronic ISSN
1872-941X
Official links

FAQ

Frequently asked questions about Microelectronics Reliability

What CAS zone is Microelectronics Reliability in?

In the 2025 upgraded edition of the CAS Journal Ranking, Microelectronics Reliability is in Zone 3 of Engineering, and in Zone 3 of the minor category Physics, Applied / Engineering, Electrical & Electronic / Nanoscience & Nanotechnology. In the 2026 Xinrui edition it is in Zone 4 of Engineering. Zones from different editions, and from major and minor categories, are not interchangeable.

What is the impact factor of Microelectronics Reliability?

The latest impact factor listed by LetPub is 2.42; CiteScore 4.5, h-index 133.

How long does peer review take at Microelectronics Reliability?

The publisher reports about 121 days (submission to acceptance); authors report an average review time of 2–4 weeks; the community-reported acceptance is “Easy”. Article statistics cover accepted papers only, publisher figures follow the journal's own definitions, and community reports come from authors' own submissions; none is a promise from the journal.

What are the manuscript requirements of Microelectronics Reliability?

According to the journal's author guidelines: Abstract: ≤ 250 words; Keywords: 1–7; Reference style: Numbered, in order of citation; Highlights: Required. A model extracted these from the author guidelines and each was checked against the text; check the latest version on the journal's website before submitting.

Where are the editorial board members of Microelectronics Reliability based?

Of the 68 board members whose country the journal's board page names, 3 (about 4%) are in mainland China; the countries named most often are United States (16), Italy (7) and France (6). Counted from the institutions listed on the board page; for reference only.

Which databases index Microelectronics Reliability?

According to LetPub and DOAJ records, Microelectronics Reliability is indexed in SCIE and Scopus.

Is Microelectronics Reliability open access, and what is the APC?

Microelectronics Reliability is a hybrid journal. For open-access publication: APC about USD 2,280.

Sources and updates

The facts on this page come from LetPub, Publisher website, OpenAlex; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-26). Last updated: .