Journal profile · Engineering, Electrical & Electronic
IEEE Transactions on Device and Materials Reliability
ISSN 1530-4388 · eISSN 1558-2574 · Institute of Electrical and Electronics Engineers Inc. · UNITED STATES · Quarterly
IEEE Transactions on Device and Materials Reliability: CAS Zone 3 · Engineering (2025 upgraded edition); impact factor 2.64; subscription journal; APC about USD 2,645; review 6–12 weeks (community reports); community-reported acceptance: fairly easy; 151 articles in 2025; indexed in SCIE and Scopus.
Scope
Aims, scope and focus
IEEE Transactions on Device and Materials Reliability is published by Institute of Electrical and Electronics Engineers Inc. and is in Zone 3 of Engineering in the CAS Journal Ranking (2025 upgraded edition). By OpenAlex counts of its recent articles, its largest topics are Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis, together about 43.6% of its articles. Its main subfields are Electrical and Electronic Engineering. (generated from OpenAlex topic counts and CAS ranking data)
IEEE Transactions on Device and Materials Reliability publishes original research on the reliability of electronic materials, fabrication processes, devices (such as FETs and bipolar transistors), interconnects, ICs, integrated microsystems (including MEMS and sensors), thin-film technologies, memories, packaging and heterogeneous assemblies—spanning both established and emerging fields. The journal welcomes contributions that advance understanding of degradation, failure mechanisms, long-term performance, and fatigue behavior through experimental studies integrated with modeling and simulation.
From the journal's Aims & Scope
Research area (LetPub): Engineering, Electrical & Electronic
Editor-in-chief Isodiana CrupiPublisher website
Main research topics OpenAlex counts of recent articles; shares are approximate
- Semiconductor materials and devicesEngineering17.5%
- Advancements in Semiconductor Devices and Circuit DesignEngineering15.1%
- Integrated Circuits and Semiconductor Failure AnalysisEngineering11%
- Electronic Packaging and Soldering TechnologiesEngineering7.3%
- Ferroelectric and Negative Capacitance DevicesEngineering5.4%
- Silicon Carbide Semiconductor TechnologiesEngineering5.3%
- Electrostatic Discharge in ElectronicsEngineering4.8%
- Radiation Effects in ElectronicsEngineering4.3%
Rankings & indexing
CAS ranking and database indexing
CAS Journal Ranking
CAS Journal Ranking, upgraded edition (March 2025)Engineering Zone 3
| Level | Category | Zone |
|---|---|---|
| Major | Engineering | Zone 3 |
| Minor | Engineering, Electrical & Electronic | Zone 3 |
| Minor | Physics, Applied | Zone 3 |
Top journal: noReview journal: no
CAS Xinrui Journal Ranking (March 2026)Engineering Zone 3
| Level | Category | Zone |
|---|---|---|
| Major | Engineering | Zone 3 |
| Minor | Engineering, Electrical & Electronic | Zone 3 |
| Minor | Physics, Applied | Zone 3 |
Top journal: noReview journal: not marked
CAS Journal Ranking, previous upgraded edition (December 2023)Engineering Zone 3
| Level | Category | Zone |
|---|---|---|
| Major | Engineering | Zone 3 |
| Minor | Engineering, Electrical & Electronic | Zone 3 |
| Minor | Physics, Applied | Zone 3 |
Top journal: noReview journal: no
Database indexing
SCIEScopusLetPub
International journal early-warning lists: not listed in any editionLetPub
Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.
Metrics
Impact metrics and publication volume
Impact
- Impact factor
- 2.64LetPub ·
- Impact factor (publisher)
- 2.7Publisher website ·
- CiteScore 2026-06
- 4.6LetPub ·
- CiteScore (publisher)
- 4.6Publisher website ·
- SJR 2026-06
- 0.45LetPub ·
- SNIP 2026-06
- 1.37LetPub ·
- h-index
- 63LetPub ·
- h-index
- 90OpenAlex ·
- i10-index
- 1,094OpenAlex ·
- 2-year mean citedness
- 2.16OpenAlex ·
- Self-citation rate
- 7.4%LetPub ·
- Share of gold OA articles
- 1.55%LetPub ·
Volume
- Articles per year
- 112LetPub ·
Articles by year OpenAlex count · 2,820 in total · the current year is incomplete
| Year | Articles | Open access | Citations |
|---|---|---|---|
| 2026 | 121 | 9 | 99 |
| 2025 | 151 | 13 | 241 |
| 2024 | 109 | 15 | 482 |
| 2023 | 102 | 34 | 634 |
| 2022 | 96 | 49 | 771 |
| 2021 | 120 | 50 | 1,204 |
Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.
Review & acceptance
Review time and acceptance
- Average review time (community reports)
- 6–12 weeksLetPub ·
- Average acceptance (community reports)
- Fairly easyLetPub ·
Community reports come from authors' own submissions (confidence 0.5) and are not a promise from the journal; for publisher figures, the journal's own definitions apply.
Fees & open access
APC and open-access policy
Subscription journalLetPub
A subscription journal: articles are read by subscription or purchase, and authors usually pay no publication charge.
| Source | APC | Fee waiver | License | Observed |
|---|---|---|---|---|
| OpenAlex | USD 2,645 | — | — | |
| Publisher website | USD 2,800 | — | — |
The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.
Profile
Publication details and official links
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Country or region
- UNITED STATES
- Language
- English
- Frequency
- Quarterly
- ISSN
- 1530-4388
- Electronic ISSN
- 1558-2574
- Official links
- Journal homepage ↗OpenAlex
- Submission system ↗LetPub
FAQ
Frequently asked questions about IEEE Transactions on Device and Materials Reliability
What CAS zone is IEEE Transactions on Device and Materials Reliability in?
In the 2025 upgraded edition of the CAS Journal Ranking, IEEE Transactions on Device and Materials Reliability is in Zone 3 of Engineering, and in Zone 3 of the minor category Engineering, Electrical & Electronic / Physics, Applied. In the 2026 Xinrui edition it is in Zone 3 of Engineering. Zones from different editions, and from major and minor categories, are not interchangeable.
What is the impact factor of IEEE Transactions on Device and Materials Reliability?
The latest impact factor listed by LetPub is 2.64; CiteScore 4.6, h-index 90.
How long does peer review take at IEEE Transactions on Device and Materials Reliability?
Authors report an average review time of 6–12 weeks; the community-reported acceptance is “Fairly easy”. Article statistics cover accepted papers only, publisher figures follow the journal's own definitions, and community reports come from authors' own submissions; none is a promise from the journal.
Which databases index IEEE Transactions on Device and Materials Reliability?
According to LetPub and DOAJ records, IEEE Transactions on Device and Materials Reliability is indexed in SCIE and Scopus.
Is IEEE Transactions on Device and Materials Reliability open access, and what is the APC?
IEEE Transactions on Device and Materials Reliability is a subscription journal. APC about USD 2,645.
Sources and updates
The facts on this page come from LetPub, OpenAlex, Publisher website; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-25). Last updated: .