Journal profile · COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Design & Test

ISSN 2168-2356 · eISSN 2168-2364 · IEEE Computer Society · UNITED STATES

IEEE Design & Test: CAS Zone 4 · Computer Science (2025 upgraded edition); impact factor 1.96; subscription journal; 110 articles in 2025; indexed in SCIE and Scopus.

Impact factor1.96Latest value listed by LetPub
CAS zoneZone 4 · Computer Science2025 upgraded edition, major category · 2026 Xinrui edition Zone 4 · Computer Science
Review time—No reports yet
APC—No source gives fee information
Acceptance—No reports yet
Articles per year1102025 · OpenAlex count

Scope

Aims, scope and focus

IEEE Design & Test is published by IEEE Computer Society and is in Zone 4 of Computer Science in the CAS Journal Ranking (2025 upgraded edition). By OpenAlex counts of its recent articles, its largest topics are VLSI and Analog Circuit Testing, Diverse Scientific and Economic Studies and Human auditory perception and evaluation, together about 26.4% of its articles. Its main subfields are Hardware and Architecture and Electrical and Electronic Engineering. (generated from OpenAlex topic counts and CAS ranking data)

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

Source: LetPub

Research area (LetPub): COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

Main research topics OpenAlex counts of recent articles; shares are approximate

  1. VLSI and Analog Circuit TestingComputer Science10.7%
  2. Diverse Scientific and Economic StudiesEconomics, Econometrics and Finance9.6%
  3. Human auditory perception and evaluationEngineering6.1%
  4. Ferroelectric and Negative Capacitance DevicesEngineering5.9%
  5. Integrated Circuits and Semiconductor Failure AnalysisEngineering5.5%
  6. Physical Unclonable Functions (PUFs) and Hardware SecurityComputer Science5.4%
  7. Advanced Memory and Neural ComputingEngineering5.1%
  8. Educational Robotics and EngineeringComputer Science4.9%

Rankings & indexing

CAS ranking and database indexing

CAS Journal Ranking

CAS Journal Ranking, upgraded edition (March 2025)Computer Science Zone 4
LevelCategoryZone
MajorComputer ScienceZone 4
MinorComputer Science, Hardware & ArchitectureZone 4
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: no

CAS Xinrui Journal Ranking (March 2026)Computer Science Zone 4
LevelCategoryZone
MajorComputer ScienceZone 4
MinorComputer Science, Hardware & ArchitectureZone 4
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: not marked

CAS Journal Ranking, previous upgraded edition (December 2023)Engineering Zone 4
LevelCategoryZone
MajorEngineeringZone 4
MinorComputer Science, Hardware & ArchitectureZone 4
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: no

Database indexing

SCIEScopusLetPub

International journal early-warning lists: not listed in any editionLetPub

Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.

Metrics

Impact metrics and publication volume

Impact

Impact factor
1.96LetPub ·
CiteScore 2026-06
4.2LetPub ·
SJR 2026-06
0.47LetPub ·
SNIP 2026-06
0.93LetPub ·
h-index
72LetPub ·
h-index
49OpenAlex ·
i10-index
289OpenAlex ·
2-year mean citedness
1.42OpenAlex ·
Self-citation rate
5%LetPub ·
Share of gold OA articles
0%LetPub ·

Volume

Articles per year
38LetPub ·

Articles by year OpenAlex count · 1,800 in total · the current year is incomplete

YearArticlesOpen accessCitations
20268502
2025110589
202410232332
202310452579
20229946463
2021146961,018

Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.

Fees & open access

APC and open-access policy

Subscription journalLetPub

A subscription journal: articles are read by subscription or purchase, and authors usually pay no publication charge.

No source has fee information yet; check the journal's website.

The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.

Profile

Publication details and official links

Publisher
IEEE Computer Society
Country or region
UNITED STATES
Language
English
ISSN
2168-2356
Electronic ISSN
2168-2364
Official links

FAQ

Frequently asked questions about IEEE Design & Test

What CAS zone is IEEE Design & Test in?

In the 2025 upgraded edition of the CAS Journal Ranking, IEEE Design & Test is in Zone 4 of Computer Science, and in Zone 4 of the minor category Computer Science, Hardware & Architecture / Engineering, Electrical & Electronic. In the 2026 Xinrui edition it is in Zone 4 of Computer Science. Zones from different editions, and from major and minor categories, are not interchangeable.

What is the impact factor of IEEE Design & Test?

The latest impact factor listed by LetPub is 1.96; CiteScore 4.2, h-index 49.

Which databases index IEEE Design & Test?

According to LetPub and DOAJ records, IEEE Design & Test is indexed in SCIE and Scopus.

Is IEEE Design & Test open access, and what is the APC?

IEEE Design & Test is a subscription journal. Fee information is not available yet; check the journal's website.

Sources and updates

The facts on this page come from LetPub, OpenAlex; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-25). Last updated: .