Journal profile · Engineering, Electrical & Electronic

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

ISSN 0923-8174 · eISSN 1573-0727 · Springer US · UNITED STATES · Bimonthly · Founded 1990

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS: CAS Zone 4 · Engineering (2025 upgraded edition); impact factor 1.23; hybrid open access; APC about USD 3,290; median 199 days to acceptance (81 articles, last 24 months); community-reported acceptance: easy; 56 articles in 2025; indexed in SCIE and Scopus.

Impact factor1.23Latest value listed by LetPub
CAS zoneZone 4 · Engineering2025 upgraded edition, major category · 2026 Xinrui edition Zone 4 · Engineering
Review time199 daysMedian, submission to acceptance · 81 articles, last 24 months · Crossref
APCUSD 3,290Hybrid journal: charged only for open-access articles
AcceptanceEasyCommunity average
Articles per year562025 · OpenAlex count

Scope

Aims, scope and focus

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is published by Springer US and is in Zone 4 of Engineering in the CAS Journal Ranking (2025 upgraded edition). By OpenAlex counts of its recent articles, its largest topics are VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Radiation Effects in Electronics, together about 54.4% of its articles. Its main subfields are Electrical and Electronic Engineering. (generated from OpenAlex topic counts and CAS ranking data)

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems;Testing of analog and digital electronic circuits;Testing of microprocessors, memories, and signal processing devices;Fault modeling;Test generation;Fault simulation;Testability analysis;Design for testability;Synthesis for testability;Built-in self-test;Test specification;Fault tolerance;Formal verification of hardware;Simulation for verification;Design debugging;AI methods and expert systems for test and diagnosis;Automatic test equipment (ATE);Test fixtures;Electron Beam Test Systems;Test programming;Test data analysis;Economics of testing;Quality and reliability;CAD Tools;Testing of wafer-scale integration devices;Testing of reliable systems;Manufac turing yield and design for yield improvement;Failure mode analysis and process improvement

From the journal's Aims & Scope

Research area (LetPub): Engineering, Electrical & Electronic

Editor-in-chief Vishwani D. AgrawalPublisher website

Editorial board by country: 2 in mainland China (about 4%); most named United States 22, Canada 5, Germany 4, France 4, Italy 3 (56 members with a country) Editorial board ↗Publisher website ·

Main research topics OpenAlex counts of recent articles; shares are approximate

  1. VLSI and Analog Circuit TestingComputer Science26.2%
  2. Integrated Circuits and Semiconductor Failure AnalysisEngineering17.8%
  3. Radiation Effects in ElectronicsEngineering10.5%
  4. Low-power high-performance VLSI designEngineering6%
  5. Physical Unclonable Functions (PUFs) and Hardware SecurityComputer Science3.4%
  6. VLSI and FPGA Design TechniquesEngineering3.3%
  7. Engineering and Test SystemsEngineering3.1%
  8. Semiconductor materials and devicesEngineering3%

Rankings & indexing

CAS ranking and database indexing

CAS Journal Ranking

CAS Journal Ranking, upgraded edition (March 2025)Engineering Zone 4
LevelCategoryZone
MajorEngineeringZone 4
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: no

CAS Xinrui Journal Ranking (March 2026)Engineering Zone 4
LevelCategoryZone
MajorEngineeringZone 4
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: not marked

CAS Journal Ranking, previous upgraded edition (December 2023)Engineering Zone 4
LevelCategoryZone
MajorEngineeringZone 4
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: no

Database indexing

SCIEScopusLetPub

International journal early-warning lists: not listed in any editionLetPub

Indexing the journal's website claims

EI CompendexINSPECDBLPCurrent ContentsPublisher website

Other: Google Scholar, EBSCO, ProQuest, Dimensions, CNKI, Baidu, ACM Digital Library, Naver, OCLC, Portico, CLOCKSS

As the journal's website lists them, not checked against each database; for Web of Science editions the records above apply.

Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.

Metrics

Impact metrics and publication volume

Impact

Impact factor
1.23LetPub ·
Impact factor (publisher) 2025
1.2Publisher website ·
5-year impact factor (publisher) 2025
1.2Publisher website ·
CiteScore 2026-06
2.7LetPub ·
SJR 2026-06
0.28LetPub ·
SNIP 2026-06
0.51LetPub ·
h-index
31LetPub ·
h-index
51OpenAlex ·
i10-index
563OpenAlex ·
2-year mean citedness
1.7OpenAlex ·
Self-citation rate
8.3%LetPub ·
Share of gold OA articles
10%LetPub ·

Volume

Articles per year
44LetPub ·
Downloads per year (publisher) 2025
85,800Publisher website ·

Articles by year OpenAlex count · 2,202 in total · the current year is incomplete

YearArticlesOpen accessCitations
20264584
2025561584
20246112188
20235518185
20225811360
20216419342

Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.

Review & acceptance

Review time and acceptance

Review time from article dates manuscript dates registered with Crossref · to

199 daysMedian, submission to acceptance · P25–P75 120 days – 263 days

Acceptance to online
median 22 days (81 articles)
Submission to online
median 230 days
Sample
81 articles with submission and acceptance dates (119 in the window); the latest was accepted on

Only articles that were accepted and published are counted, not the time spent on rejected manuscripts, so this usually runs longer than a publisher's "time to first decision".

Other sources

Average review time (community reports)
6–12 weeksLetPub ·
Average acceptance (community reports)
EasyLetPub ·
Submission to first decision
49 daysPublisher website ·
Peer review
Double anonymous peer reviewPublisher website

Community reports come from authors' own submissions (confidence 0.5) and are not a promise from the journal; for publisher figures, the journal's own definitions apply.

Fees & open access

APC and open-access policy

Hybrid open accessLetPub

A subscription journal in which authors can pay to publish their article open access.

SourceAPCFee waiverLicenseObserved
OpenAlexUSD 3,290 / EUR 2,690 / GBP 2,390——

A hybrid journal charges the APC only when the author chooses open access; publishing under the subscription model is usually free.

The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.

Submission

Article types and submission policies (journal website)

What to prepare4 items from the author guidelines
Abstract
150–250 words
Keywords
≥ 4
Reference style
Numbered, in order of citation
Suggested reviewers
Optional
Publisher website · model-extracted, each line checked against the text
Policy excerpts from the journal's websiteAI use, Authorship, Conflicts of interest, Data availability, Publication ethics, License & copyright, Open access, Plagiarism
AI use Generative AI Images

LLMs cannot be authors; AI use must be documented Model summary

Please check Springer’s policy on generative AI images and make sure your work adheres to the principles described therein. Back to top

Source ↗Publisher website ·
Authorship Authorship principles

These guidelines describe authorship principles and good authorship practices to which prospective authors should adhere to. Authorship clarified The Journal and Publisher assume all authors agreed with the content and that all gave explicit consent to submit and that they obtained consent from the responsible authorities at the institute/organization where the work has been carried out, before th…

Source ↗Publisher website ·
Conflicts of interest Disclosures and declarations

Competing interests disclosure required Model summary

All authors are requested to include information regarding sources of funding, financial or non-financial interests, study-specific approval by the appropriate ethics committee for research involving humans and/or animals, informed consent if the research involved human participants, and a statement on welfare of animals if the research involved animals (as appropriate). The decision whether such …

Source ↗Publisher website ·
Data availability Data availability statements

Data and code availability expected Model summary

All original research must include a data availability statement. This statement should explain how to access data supporting the results and analysis in the article, including links/citations to publicly archived datasets analysed or generated during the study. Please see our full policy here. If it is not possible to share research data publicly, for instance when individual privacy could be com…

Source ↗Publisher website ·
Publication ethics Compliance with Ethical Standards

To ensure objectivity and transparency in research and to ensure that accepted principles of ethical and professional conduct have been followed, authors should include information regarding sources of funding, potential conflicts of interest (financial or non-financial), informed consent if the research involved human participants, and a statement on welfare of animals if the research involved an…

Source ↗Publisher website ·
License & copyright Copyright

Open Choice articles do not require transfer of copyright as the copyright remains with the author. In opting for open access, the author(s) agree to publish the article under a Creative Commons license. Details of the OA licences offered to authors can be found on the individual journal website, in the journal's How to publish with us guide. Back to top

Source ↗Publisher website ·
Open access Open access publishing

To find out more about publishing your work Open Access in Journal of Electronic Testing, including information on fees, funding and licences, visit our Open access publishing page. Back to top

Source ↗Publisher website ·
Plagiarism

Plagiarism screening may be used Model summary

the journal may use software to screen for plagiarism

Source ↗Publisher website ·

Excerpts are quoted from the journal's website; "model summary" lines are written by Workers AI and checked against the text. The journal's website is authoritative.

Profile

Publication details and official links

Publisher
Springer US
Country or region
UNITED STATES
Language
English
Frequency
Bimonthly
Founded
1990
ISSN
0923-8174
Electronic ISSN
1573-0727
Latest issue on the website
Volume 42, Issue 4 (August 2026)
Official links

FAQ

Frequently asked questions about JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

What CAS zone is JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS in?

In the 2025 upgraded edition of the CAS Journal Ranking, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is in Zone 4 of Engineering, and in Zone 4 of the minor category Engineering, Electrical & Electronic. In the 2026 Xinrui edition it is in Zone 4 of Engineering. Zones from different editions, and from major and minor categories, are not interchangeable.

What is the impact factor of JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?

The latest impact factor listed by LetPub is 1.23; CiteScore 2.7, h-index 51.

How long does peer review take at JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?

Based on the dates recorded on 81 articles published between October 2024 and October 2026 (the last 24 months), the median time from submission to acceptance is 199 days (interquartile range 120–263 days); authors report an average review time of 6–12 weeks; the community-reported acceptance is “Easy”. Article statistics cover accepted papers only, publisher figures follow the journal's own definitions, and community reports come from authors' own submissions; none is a promise from the journal.

What are the manuscript requirements of JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?

According to the journal's author guidelines: Abstract: 150–250 words; Keywords: ≥ 4; Reference style: Numbered, in order of citation; Suggested reviewers: Optional. A model extracted these from the author guidelines and each was checked against the text; check the latest version on the journal's website before submitting.

Where are the editorial board members of JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS based?

Of the 56 board members whose country the journal's board page names, 2 (about 4%) are in mainland China; the countries named most often are United States (22), Canada (5) and Germany (4). Counted from the institutions listed on the board page; for reference only.

Which databases index JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS?

According to LetPub and DOAJ records, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is indexed in SCIE and Scopus. The journal's website also lists EI Compendex, INSPEC, DBLP and Current Contents; that list has not been checked against each database.

Is JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS open access, and what is the APC?

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is a hybrid journal. For open-access publication: APC about USD 3,290.

Sources and updates

The facts on this page come from LetPub, OpenAlex, Publisher website; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-25). Last updated: .