Journal profile · Biochemistry, Genetics and Molecular Biology-Biotechnology

IEEE Journal of the Electron Devices Society

ISSN 2168-6734 · Institute of Electrical and Electronics Engineers Inc. · UNITED STATES

IEEE Journal of the Electron Devices Society: CAS Zone 3 · Engineering (2025 upgraded edition); impact factor 2.86; fully open access; APC about USD 1,350; review about 9 weeks (community reports); 191 articles in 2025; indexed in SCIE and Scopus.

Impact factor2.86Latest value listed by LetPub
CAS zoneZone 3 · Engineering2025 upgraded edition, major category · 2026 Xinrui edition Zone 3 · Engineering
Review timeabout 9 weeksCommunity average
APCUSD 1,350Fully open access
Acceptance—No reports yet
Articles per year1912025 · OpenAlex count

Scope

Aims, scope and focus

IEEE Journal of the Electron Devices Society is published by Institute of Electrical and Electronics Engineers Inc. and is in Zone 3 of Engineering in the CAS Journal Ranking (2025 upgraded edition). By OpenAlex counts of its recent articles, its largest topics are Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Ferroelectric and Negative Capacitance Devices, together about 41% of its articles. Its main subfields are Electrical and Electronic Engineering. (generated from OpenAlex topic counts and CAS ranking data)

The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC's, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original. All research papers benefit from rapid peer review and publication, and are deposited in IEEE Xplore.

From the journal's Aims & Scope

Research area (LetPub): Biochemistry, Genetics and Molecular Biology-Biotechnology

Editor-in-chief Man WongPublisher website

Editorial board by country: 4 in mainland China (about 6%); most named United States 22, Taiwan, China 9, Canada 8, Mainland China 4, Singapore 4 (64 members with a country) Editorial board ↗Publisher website ·

Main research topics OpenAlex counts of recent articles; shares are approximate

  1. Semiconductor materials and devicesEngineering18.8%
  2. Advancements in Semiconductor Devices and Circuit DesignEngineering14.3%
  3. Ferroelectric and Negative Capacitance DevicesEngineering7.8%
  4. Silicon Carbide Semiconductor TechnologiesEngineering7.1%
  5. Thin-Film Transistor TechnologiesEngineering6%
  6. GaN-based semiconductor devices and materialsPhysics and Astronomy5.8%
  7. Advanced Memory and Neural ComputingEngineering5.6%
  8. Semiconductor materials and interfacesPhysics and Astronomy3.6%

Rankings & indexing

CAS ranking and database indexing

CAS Journal Ranking

CAS Journal Ranking, upgraded edition (March 2025)Engineering Zone 3
LevelCategoryZone
MajorEngineeringZone 3
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: no

CAS Xinrui Journal Ranking (March 2026)Engineering Zone 3
LevelCategoryZone
MajorEngineeringZone 3
MinorEngineering, Electrical & ElectronicZone 3

Top journal: noReview journal: not marked

CAS Journal Ranking, previous upgraded edition (December 2023)Engineering Zone 3
LevelCategoryZone
MajorEngineeringZone 3
MinorEngineering, Electrical & ElectronicZone 4

Top journal: noReview journal: no

Database indexing

SCIEScopusDOAJLetPub

International journal early-warning lists: not listed in any editionLetPub

Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.

Metrics

Impact metrics and publication volume

Impact

Impact factor
2.86LetPub ·
Impact factor (publisher)
2.9Publisher website ·
CiteScore 2026-06
4.8LetPub ·
CiteScore (publisher)
4.8Publisher website ·
SJR 2026-06
0.51LetPub ·
SNIP 2026-06
1.22LetPub ·
h-index
23LetPub ·
h-index
64OpenAlex ·
i10-index
791OpenAlex ·
2-year mean citedness
2.78OpenAlex ·
Self-citation rate
3.4%LetPub ·
Share of gold OA articles
100%LetPub ·

Volume

Articles per year
179LetPub ·
Articles per year (publisher)
250Publisher website ·

Articles by year OpenAlex count · 2,003 in total · the current year is incomplete

YearArticlesOpen accessCitations
202610710711
2025191191408
2024168168878
20231241241,136
20221441441,416
20211871872,459

Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.

Review & acceptance

Review time and acceptance

Average review time (community reports)
about 9 weeksLetPub ·
Submission to publication (journal-reported)
about 9 weeksDOAJ ·
Peer review
Single anonymous peer reviewDOAJ

Community reports come from authors' own submissions (confidence 0.5) and are not a promise from the journal; for publisher figures, the journal's own definitions apply.

Fees & open access

APC and open-access policy

Fully open accessDOAJ

Every article is open access; authors usually pay an article processing charge (APC).

SourceAPCFee waiverLicenseObserved
DOAJUSD 1,350YesCC BY, CC BY-NC-ND
OpenAlexUSD 1,350——
LetPubUSD 1,350Yes—
Publisher websiteUSD 1,350——

The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.

Profile

Publication details and official links

Publisher
Institute of Electrical and Electronics Engineers Inc.
Country or region
UNITED STATES
Language
English
ISSN
2168-6734
Official links

FAQ

Frequently asked questions about IEEE Journal of the Electron Devices Society

What CAS zone is IEEE Journal of the Electron Devices Society in?

In the 2025 upgraded edition of the CAS Journal Ranking, IEEE Journal of the Electron Devices Society is in Zone 3 of Engineering, and in Zone 4 of the minor category Engineering, Electrical & Electronic. In the 2026 Xinrui edition it is in Zone 3 of Engineering. Zones from different editions, and from major and minor categories, are not interchangeable.

What is the impact factor of IEEE Journal of the Electron Devices Society?

The latest impact factor listed by LetPub is 2.86; CiteScore 4.8, h-index 64.

How long does peer review take at IEEE Journal of the Electron Devices Society?

Authors report an average review time of about 9 weeks. Article statistics cover accepted papers only, publisher figures follow the journal's own definitions, and community reports come from authors' own submissions; none is a promise from the journal.

Where are the editorial board members of IEEE Journal of the Electron Devices Society based?

Of the 64 board members whose country the journal's board page names, 4 (about 6%) are in mainland China; the countries named most often are United States (22), Taiwan, China (9) and Canada (8). Counted from the institutions listed on the board page; for reference only.

Which databases index IEEE Journal of the Electron Devices Society?

According to LetPub and DOAJ records, IEEE Journal of the Electron Devices Society is indexed in SCIE, Scopus and DOAJ.

Is IEEE Journal of the Electron Devices Society open access, and what is the APC?

IEEE Journal of the Electron Devices Society is a fully open-access journal. APC about USD 1,350.

Sources and updates

The facts on this page come from LetPub, OpenAlex, DOAJ, Publisher website; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-26). Last updated: .