Journal profile · Engineering, Electrical & Electronic
IEEE Design & Test of Computers
ISSN 0740-7475 · UNITED STATES · Bimonthly · Founded 1984
IEEE Design & Test of Computers: subscription journal; review over 12 weeks (community reports); community-reported acceptance: fairly easy; 0 articles in 2025; the journal's website says it has ceased publication.
The journal's website says it has ceased publication: This title ceased publication in 2012. The current retitled publication is IEEE Design & Test. Source ↗Publisher website ·
Scope
Aims, scope and focus
By OpenAlex counts of its recent articles, IEEE Design & Test of Computers's largest topics are VLSI and Analog Circuit Testing, Embedded Systems Design Techniques and VLSI and FPGA Design Techniques, together about 49.2% of its articles. Its main subfields are Electrical and Electronic Engineering and Hardware and Architecture. (generated from OpenAlex topic counts and CAS ranking data)
IEEE Design & Test of Computers offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test of Computers is published by the IEEE Computer Society in technical cosponsorship with the IEEE Circuits and Systems Society.
From the journal's Aims & Scope
Research area (LetPub): Engineering, Electrical & Electronic
Main research topics OpenAlex counts of recent articles; shares are approximate
- VLSI and Analog Circuit TestingComputer Science22.2%
- Embedded Systems Design TechniquesComputer Science14.4%
- VLSI and FPGA Design TechniquesEngineering12.6%
- Software Testing and Debugging TechniquesComputer Science9.2%
- Low-power high-performance VLSI designEngineering5.5%
- Radiation Effects in ElectronicsEngineering5.5%
- Integrated Circuits and Semiconductor Failure AnalysisEngineering5.4%
- Engineering and Test SystemsEngineering5.3%
Rankings & indexing
CAS ranking and database indexing
CAS Journal Ranking
CAS Journal Ranking, upgraded edition (March 2025)Not covered
Not covered by this edition.
CAS Xinrui Journal Ranking (March 2026)Not covered
Not covered by this edition.
CAS Journal Ranking, previous upgraded edition (December 2023)Not covered
Not covered by this edition.
Database indexing
Indexed in: no record yet.
International journal early-warning lists: not listed in any editionLetPub
Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.
Metrics
Impact metrics and publication volume
Impact
- h-index
- 111OpenAlex ·
- i10-index
- 799OpenAlex ·
- 2-year mean citedness
- 0OpenAlex ·
- Share of gold OA articles
- 0%LetPub ·
Volume
- Articles per year
- 41LetPub ·
Articles by year OpenAlex count · 3,017 in total · the current year is incomplete
| Year | Articles | Open access | Citations |
|---|---|---|---|
| 2026 | 0 | 0 | 447 |
| 2025 | 0 | 0 | 728 |
| 2024 | 0 | 0 | 767 |
| 2023 | 1 | 0 | 913 |
| 2022 | 0 | 0 | 1,038 |
| 2021 | 0 | 0 | 1,266 |
Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.
Review & acceptance
Review time and acceptance
- Average review time (community reports)
- over 12 weeksLetPub ·
- Average acceptance (community reports)
- Fairly easyLetPub ·
Community reports come from authors' own submissions (confidence 0.5) and are not a promise from the journal; for publisher figures, the journal's own definitions apply.
Fees & open access
APC and open-access policy
Subscription journalLetPub
A subscription journal: articles are read by subscription or purchase, and authors usually pay no publication charge.
No source has fee information yet; check the journal's website.
The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.
Profile
Publication details and official links
- Country or region
- UNITED STATES
- Frequency
- Bimonthly
- Founded
- 1984
- ISSN
- 0740-7475
- Official links
- Journal homepage ↗LetPub
- Submission system ↗LetPub
FAQ
Frequently asked questions about IEEE Design & Test of Computers
How long does peer review take at IEEE Design & Test of Computers?
Authors report an average review time of over 12 weeks; the community-reported acceptance is “Fairly easy”. Article statistics cover accepted papers only, publisher figures follow the journal's own definitions, and community reports come from authors' own submissions; none is a promise from the journal.
Is IEEE Design & Test of Computers open access, and what is the APC?
IEEE Design & Test of Computers is a subscription journal. Fee information is not available yet; check the journal's website.
Sources and updates
The facts on this page come from LetPub, OpenAlex, Publisher website; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-25). Last updated: .