Journal profile · Engineering-Safety, Risk, Reliability and Quality
Electronic Device Failure Analysis
ISSN 1537-0755 · ASM International
Electronic Device Failure Analysis: subscription journal; 21 articles in 2025; indexed in Scopus.
Scope
Aims, scope and focus
Electronic Device Failure Analysis is published by ASM International. By OpenAlex counts of its recent articles, its largest topics are Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Advanced Materials Characterization Techniques, together about 53.6% of its articles. Its main subfields are Electrical and Electronic Engineering. (generated from OpenAlex topic counts and CAS ranking data)
Research area (LetPub): Engineering-Safety, Risk, Reliability and Quality
Main research topics OpenAlex counts of recent articles; shares are approximate
- Integrated Circuits and Semiconductor Failure AnalysisEngineering34%
- VLSI and Analog Circuit TestingComputer Science13.4%
- Advanced Materials Characterization TechniquesEngineering6.3%
- Physical Unclonable Functions (PUFs) and Hardware SecurityComputer Science5.3%
- Mechanical Failure Analysis and SimulationEngineering5.1%
- Electronic Packaging and Soldering TechnologiesEngineering4%
- Semiconductor materials and devicesEngineering3.7%
- 3D IC and TSV technologiesEngineering3.3%
Rankings & indexing
CAS ranking and database indexing
CAS Journal Ranking
CAS Journal Ranking, upgraded edition (March 2025)Not covered
Not covered by this edition.
CAS Xinrui Journal Ranking (March 2026)Not covered
Not covered by this edition.
CAS Journal Ranking, previous upgraded edition (December 2023)Not covered
Not covered by this edition.
CiteScore quartiles (Scopus, June 2026 release)
| Subject | Quartile | Rank | Percentile |
|---|---|---|---|
| Safety, Risk, Reliability and Quality | Q4 | 229/282 | 18th |
| Electrical and Electronic Engineering | Q4 | 914/1030 | 11th |
Scopus ranks journals by CiteScore within each subject: the 75th percentile and above is Q1, then a quartile every 25 points. A different system from the CAS zones.LetPub
Database indexing
ScopusLetPub
International journal early-warning lists: not listed in any editionLetPub
Editions, and major and minor categories, are shown separately and never merged into one zone; check which edition your institution uses before you submit or report.
Metrics
Impact metrics and publication volume
Impact
- CiteScore 2026-06
- 0.4LetPub ·
- SJR 2026-06
- 0.11LetPub ·
- SNIP 2026-06
- 0.06LetPub ·
- h-index
- 8OpenAlex ·
- i10-index
- 6OpenAlex ·
- 2-year mean citedness
- 0.2OpenAlex ·
- Share of gold OA articles
- 0%LetPub ·
Articles by year OpenAlex count · 501 in total · the current year is incomplete
| Year | Articles | Open access | Citations |
|---|---|---|---|
| 2026 | 15 | 0 | 22 |
| 2025 | 21 | 1 | 37 |
| 2024 | 19 | 0 | 27 |
| 2023 | 19 | 1 | 32 |
| 2022 | 20 | 0 | 14 |
| 2021 | 22 | 2 | 27 |
Sources count differently and were observed at different times, so each source's own value is kept; "publisher" marks figures from the journal's website.
Fees & open access
APC and open-access policy
Subscription journalLetPub
A subscription journal: articles are read by subscription or purchase, and authors usually pay no publication charge.
No source has fee information yet; check the journal's website.
The journal's website is authoritative for fees; sources were observed at different times and each keeps its own value, without averaging.
Profile
Publication details and official links
- Publisher
- ASM International
- ISSN
- 1537-0755
FAQ
Frequently asked questions about Electronic Device Failure Analysis
Which databases index Electronic Device Failure Analysis?
According to LetPub and DOAJ records, Electronic Device Failure Analysis is indexed in Scopus.
Is Electronic Device Failure Analysis open access, and what is the APC?
Electronic Device Failure Analysis is a subscription journal. Fee information is not available yet; check the journal's website.
Sources and updates
The facts on this page come from LetPub, OpenAlex; every figure is tagged with its source and the date it was observed, and conflicting values are kept per source. LetPub source page: view ↗ (archived 2026-08-25). Last updated: .